Cosmic Ray Effects on Microelectronics. Part 4
A 1986 Defense Technical Information Center technical report on cosmic ray effects on microelectronics, written for military and spacecraft engineers and aimed at radiation hardening of digital systems. The one picture is a rotated line graph with two curves plotted against a numeric scale, labelled direct ionization and proton-induced, with a sharp peak near the low end and a rising curve climbing to the right; a designer might take from it the plain chart style of sparse black linework, handwritten-looking labels and a rotated page layout.
